Diffractometers - an overview | ScienceDirect Topics
Omega/Theta XRD
Quality Improvement of GaN Epi-layers Grown with a Strain-Releasing Scheme on Suspended Ultrathin Si Nanofilm Substrate | Discover Nano
Atomic-Layer-Deposited Aluminum Oxide Thin Films Probed with X-ray Scattering and Compared to Molecular Dynamics and Density Functional Theory Models | ACS Omega
Omega–Phi compensated GID in side inclination mode for measurement of residual stress in polycrystalline thin films | Powder Diffraction | Cambridge Core
Omega-Scan: an X-ray tool for the characterization of crystal properties | SpringerLink
DDCOM XRD Benchtop System
XRD Phi Rotation Scanning | Materials Characterization Lab
2θ-ω Symmetrical and Rocking Curve scans using Mirror + PPC
Application of rocking-scan method to detect the low-content diamonds in a complex mixture - ScienceDirect
Low pressure chemical vapor deposition high temperature growth of β-Ga2O3 on Si and C face 4H-SiC - American Chemical Society
High-Resolution X-ray Diffraction
X-ray for characterization of thin films
Bulk-like dielectric and magnetic properties of sub 100 nm thick single crystal Cr2O3 films on an epitaxial oxide electrode | Scientific Reports
XRD Phi Rotation Scanning | Materials Characterization Lab
A novel high-resolution XRD apparatus for patterned epitaxial films in a 50pm pad area with a convergent micro X-ray beam
X-ray for characterization of thin films
Introduction to High Resolution X-Ray Diffraction of Epitaxial Thin Films
Omega-scan - Freiberg Instruments - lifetime, single crystal orientation, PID, automation and more
X-ray diffraction pattern in omega scan on one side of the cylindrical... | Download Scientific Diagram
AERIS FOR THIN FILMS: GRAZING INCIDENCE X-RAY DIFFRACTION 사이언스21 입니다.
